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Optical Beam NFP Measurement System

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Optical Beam Near Field Pattern Measurement System

Optical beam pattern measurement and analysis system in combination with NFP measurement optics & Optical Beam Analysis Module AP013. Best for beam pattern evaluation of various optical devices, modules, and components.
Optical beam NFP/beam profile observation and analysis of LD, fiber, waveguide and various optical devices
Evaluation, assembling adjustment of various optical modules
Depending on wavelength a high-resolution CCD image sensor or InGaAs high sensitivity image sensor
Standard up to 300mW power, high power 1-10W
beam size ~0.05 - 1mm diameter

1. ISA071 high resolution CMOS image sensor 400nm - 1100nm wavelength range
OR
  ISA041H2 InGaAs high sensitivity image sensor 900nm - 1700nm wavelength range
2. Basic M-Scope type L optics
OR
Advanced M-Scope type S optics with OBJECTIVE LENS and optional Coaxial epi-illumination unit
OR
Basic high power 1-10W M-Scope type HL optics
  OR
Advanced high power 1-10W M-Scope type HS optics with OBJECTIVE LENS and optional Coaxial epi-illumination unit
3. NEUTRAL DENSITY FILTER
4. MANUAL STAGE  (XYZ, XYZ+θxθy, or Z-axis)
5. OPTICAL BEAM ANALYSIS MODULE

ACCESSORIES:
OPTICAL LAUNCH OPTICS (on the incident side, not used for measurement)
  M-Scope type G   Underfilled launch optical system
  M-Scope type ML  Mode-selective launch optical system